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QMAXIS Testing (Nanjing) Ltd.

0086-186-0255-6086

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Leica DM4 P Leica Polarization Microscope - Fully Encoded Semiautomatic Microscope
Leica DM3 XL Leica Material Microscope - Rapid Detection and Inspection System for Microelectronics and Semiconductors 笔记双语对照
Leica DM8000&12000 M Leica Material Microscope - High Capacity 8 "Inspection and Defect Analysis System
Leica DCM8 confocal interference microscope 3D optical surface measurement system
Leica DM6 M LIBS Material Analysis Two in One System - No Need for Sample Preparation for Rapid and Accurate Analysis
Leica EM TXP Leica Precision Research Integrated Machine - Electron Microscope Sample Preparation and Inspection Integrated Machine
Leica EM TRIM2 Leica Block Repair Machine - High Speed Grinding Block Repair System for Research
Leica EM TIC 3X Leica Triion Beam Cutting Instrument - New Version with Double Speed
Leica EM RES102 Leica Multifunctional Ion Thinner - Unique Ion Beam Grinding Equipment
Leica EM AFS2- Ideal instrument for low-temperature embedding and polymerization processes
Leica EM FC7 frozen ultra-thin section attachment - designed for Leica EM UC7 and EM UC6
Leica EM KMR3 Leica Glass Knife Making Machine - provides ideal slicing for electron microscopy and light microscopy

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美国QMAXIS
中国独资企业
可脉检测（南京）有限公司QMAXIS Testing (Nanjing) Ltd.
地址：No. 9 Liuchao Rd, Himalayas Building, Block J 20/F, Yuhuatai District, Nanjing China 210012

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电话：0086-186-0255-6086 0086-25-8776-3131

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